IMF Working Papers

On Brazil’s Term Structure: Stylized Facts and Analysis of Macroeconomic Interactions

By Rodrigo Cabral, Richard Munclinger, Luiz Alves, Marco Rodriguez Waldo

May 1, 2011

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Rodrigo Cabral, Richard Munclinger, Luiz Alves, and Marco Rodriguez Waldo. On Brazil’s Term Structure: Stylized Facts and Analysis of Macroeconomic Interactions, (USA: International Monetary Fund, 2011) accessed November 21, 2024
Disclaimer: This Working Paper should not be reported as representing the views of the IMF.The views expressed in this Working Paper are those of the author(s) and do not necessarily represent those of the IMF or IMF policy. Working Papers describe research in progress by the author(s) and are published to elicit comments and to further debate

Summary

This paper characterizes the term structure of Treasury bond yields for Brazil, and estimates a Nelson-Siegel Model to reproduce its stylized facts for the period 2004-2010. For this purpose, this paper uses a software developed by Fund staff. In addition, the paper estimates two versions of the Nelson-Siegel Model that incorporates macroeconomic variables with the aim of assessing the dynamic interactions between the yield curve and the macroeconomy.

Subject: Central bank policy rate, Econometric analysis, Factor models, Financial institutions, Financial services, Inflation, Prices, Sovereign bonds, Yield curve

Keywords: Brazil, Central bank policy rate, Curvature of the yield curve, Data well, Factor dynamics, Factor models, Inflation, Inflation rate, Inflation variable, Interest rates, Model II, Nelson-Siegel yield base model, Sovereign bonds, Target rate, Term structure models of interest rates, WP, Yield curve, Yield curve dynamics, Yield curve factor, Yield data well, Yield dynamics, Yield factor, Yield-macro model, Yields on bonds

Publication Details

  • Pages:

    33

  • Volume:

    ---

  • DOI:

    ---

  • Issue:

    ---

  • Series:

    Working Paper No. 2011/113

  • Stock No:

    WPIEA2011113

  • ISBN:

    9781455261420

  • ISSN:

    1018-5941