IMF Working Papers

Empirical Exchange Rate Models of the Nineties: Are Any Fit to Survive?

By Yin-Wong Cheung, Antonio Garcia Pascual, Menzie David Chinn

April 1, 2004

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Yin-Wong Cheung, Antonio Garcia Pascual, and Menzie David Chinn. Empirical Exchange Rate Models of the Nineties: Are Any Fit to Survive?, (USA: International Monetary Fund, 2004) accessed November 21, 2024
Disclaimer: This Working Paper should not be reported as representing the views of the IMF.The views expressed in this Working Paper are those of the author(s) and do not necessarily represent those of the IMF or IMF policy. Working Papers describe research in progress by the author(s) and are published to elicit comments and to further debate

Summary

We reassess exchange rate prediction using a wider set of models that have been proposed in the last decade. The performance of these models is compared against two reference specifications-purchasing power parity and the sticky-price monetary model. The models are estimated in first-difference and error-correction specifications, and model performance is evaluated at forecast horizons of 1, 4, and 20 quarters, using the mean squared error, direction of change metrics, and the "consistency" test of Cheung and Chinn (1998). Overall, model/specification/currency combinations that work well in one period do not necessarily work well in another period.

Subject: Exchange rate modelling, Exchange rates, Financial services, Foreign exchange, Interest rate modelling, Interest rate parity, Purchasing power parity

Keywords: Dollar exchange rate movement, Dollar-yen exchange rate, Exchange rate modelling, Exchange rates, Forecasting performance, Interest rate modelling, Interest rate parity, Interest rate parity model, Monetary model, Mover accent, MSE ratio, Price level, Productivity, Purchasing power parity, Random walk, Two-step procedure, U.S. dollar, WP

Publication Details

  • Pages:

    37

  • Volume:

    ---

  • DOI:

    ---

  • Issue:

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  • Series:

    Working Paper No. 2004/073

  • Stock No:

    WPIEA0732004

  • ISBN:

    9781451849493

  • ISSN:

    1018-5941